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51单片机数字电路虚拟实验设备开发+电路图+程序

时间:2019-09-28 20:55来源:毕业论文
在实验板上增加芯片检测的功能,以实验常用74LS系列芯片为检测目标,利用51单片机进行检测,当实验者在芯片插槽中插入芯片后,系统可以检测芯片型号,并将结果显示到计算机界面

摘要:随着信息技术的发展,数字集成电路得到了越来越广泛的应用,各个高校也都开设了数字电路的相关理论及实践课程。许多高校的数字电路设计实验普遍采用面包板插接及仿真软件模拟的方式,前者由于无法对连接电路的状态进行检测,在实验过程中容易出现接触不良、芯片型号错误、芯片损坏等情况,给实验增加了难度,后者由于是完全虚拟的操作,难以使学生对电路有直观的认识。针对这种情况,本次设计主要实现了在实验板上增加芯片检测的功能,以实验常用74LS系列芯片为检测目标,利用51单片机进行检测,当实验者在芯片插槽中插入芯片后,系统可以检测芯片型号,并将结果显示到计算机界面上,利用虚实结合的方式,协助实验者进行数字电路的设计。该系统将检测功能融入到实验板上,使得实验者可以在将芯片连接到电路中以后进行检测,避免了一般检测系统检测完后还需将芯片重新插入实验电路的问题,便于实验者将更多精力放到电路设计本身,而不是排查芯片问题。39687
毕业论文关键词: 数字电路实验;芯片检测;74LS系列芯片;51单片机
 The Design and Implementation of Virtual Digital Circuit Experimental Facilities
Abstract:With the development of information technology, digital integrated circuit has been widely used, many universities have opened the digital circuit course related theory and practice. In universities,the digital circuit experiments are widely based on the breadboard and simulation software, it could be quite difficult for users who use the former equipment to finish the circuit design because the breadboards are unable to check the connection state of the circuit or detect the wrong chips during the experiment. The latter one is completely virtual operation, so it is hard for students to have intuitive understanding of the circuit. For this kind of situation, the design added the function of chip detecting to the experimental board, with the aim to detect the most used 74LS series chips. The system uses 51 single chip microcomputer to detect the chips in chip socket. It can detect the chip, and send the detecting result to the computer. The system can effectively help the user find circuit and chip problems in digital circuit experiment. The function of chip detecting will be integrated into the experimental board, so that the user can detect the chip after it is connected to the circuit. Compared with the common chip detecting systems ,the new system keep users from inserting the chips into circuit again after the detecting, which facilitate the users put more effort in circuit design itself, rather than checking chip problems. 源¥自%六:维;论-文'网=www.lwfree.cn
Keywords:  digital circuit experiment; chip detecting; 74LS series chips; 51 MCU
 目  录
第1章  绪论    1
1.1 开发背景    1
1.2 同类设计研究状况和发展水平    1
1.3 设计目标    1
1.4 本文研究内容    1
第2章  系统需求与分析    3
2.1 可行性分析    3
2.1.1 技术可行性分析    3
2.1.2 操作可行性分析    3
2.1.3 经济可行性分析    3
2.2 需求分析    3
2.2.1 功能需求分析    3
2.2.2 性能需求分析    4
2.2.3 运行需求分析    4
2.3 本章小结    4
第3章  系统组成结构    5
3.1 系统总体框架    5
3.2 模块关键部件    5
3.2.1  AT89S52单片机    5
3.2.2  8255A可编程并行I/O芯片    6
3.2.3  TTL转USB通信模块    7
3.3 本章小结    7 51单片机数字电路虚拟实验设备开发+电路图+程序:http://www.lwfree.cn/zidonghua/20190928/40076.html
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